VLSI Testing and Analysis using Machine Learning

Prof. HyunJin Kim has specialized in VLSI Testing in his master course. He studied interconnection test; a new interconnection test scheme was proposed. In addition, board-level and system-level built-in-self-test architecture was researched. He has published several international articles related to VLSI Testing from 1997 to 1999 when he was graduate student under master course.

At this time, the manual analysis of test data and prediction of failure symptom is very hard due to the increasing complexity of testing environments. Now, with two projects, we focused on the analysis of VLSI testing using machine learning. Although VLSI testing is an old-fashioned topic, the analysis using machine learning is very attractive.